Simulations for a provided or custom sample, dynamical theory derivation, optical procedure, and downloadable source code.
Provided Examples
Simulate nanobeam diffraction patterns from already provided examples. These examples include an GaAl/AlGaAs qantum well structure, a StRuO3/BaTiO3 thin film, a SiGe/Si thin film, and a SrTiO3/PbTiO3 superlattice structure.
Simulate nanobeam diffraction patterns for an arbitrary semiconductor or complex oxide sample. For an accurate simulation the substrate can be included with the intensity calculated from dynamical theory.
X-ray nanobeam diffraction experiments provide new methods to characterize the nanoscale structure of materials. The diffraction patterns obtained from these experiments rely heavily on simulations to understand the complex distribution of scattered intensity from a specific sample. In previous studies the diffraction fuction for the sample consisted of the kinematical approximation for a layer thickness less than the extinction depth of the material [1]. For a more accurate distribution of intensity, the dynamical theory was imployed to allow the substrate to be included in the simulations [2]
. Figure 1 shows a comparison between the simulations and experimental data.
Karl Gardner acknowledges support from the U. S. National Science Foundation for the development of the web-based simulation through contract number DMR-1609545.
Eli Mueller acknowledges support from the U. S. National Science Foundation for the development of the web-based simulation through contract number DMR-1609545.
Jack Tilka acknowledges support from the Department of Energy Office of Basic Energy Sciences through contract number DE-FG02-04ER46147 for the development of the simulation methods.