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Simulation Examples

Below is a list of sample parameters. To simulate, just click the button below each sample parameter list.

GaAs/AlGaAs Quantum Well Structure 004 Bragg Reflection (Title Image)

Substrate: GaAs
Out of plane lattice constant and in plane lattice constant: 5.65325 Å
Layer 1: AlGaAs
Out of plane lattice constant: 5.65573 Å
203 unit cells
Layer 2: GaAs Quantum Well
Out of plane lattice constant: 5.65325 Å
16 unit cells
Layer 3 AlGaAs
Out of plane lattice constant: 5.65573 Å
203 unit cells
Angle of incidence: 26°
Colorbar Scale: Logarithmic

StRuO₃/BaTiO₃ Thin Film 002 Bragg Reflection

Substrate: NdScO₃
Out of plane lattice constant and in plane lattice constant: 4.014 Å
Layer 1: StRuO₃
Out of plane lattice constant: 3.8051 Å
16 unit cells
Layer 2: BaTiO₃
Out of plane lattice constant: 4.014 Å
192 unit cells
Angle of incidence: 17.979°
Colorbar Scale: Logarithmic

SiGe/Si Thin Film

This pattern is the reflection between the Si (004) Bragg peak at θ = 27.41 degrees and the strained SiGe (004) Bragg peak at θ = 26.95 degrees.

Substrate: No Substrate
Layer 1: Si
Out of plane lattice constant: 5.387 Å
50
Layer 2: SiGe
Out of plane lattice constant: 5.4719 Å
200 unit cells
Angle of incidence: 27.2°
Colorbar Scale: Linear

SrTiO₃/PbTiO₃ Superlattice Structure 004 Bragg Reflection

Substrate: SrTiO₃
Out of plane lattice constant and in plane lattice constant: 3.905 Å
Layer 1: StTiO₃
Out of plane lattice constant: 3.905 Å
10 unit cells
Layer 2: PbTiO₃
Out of plane lattice constant: 4.152 Å
10 unit cells
20 periods in superlattice
Angle of incidence: 17.979°
Colorbar Scale: Logarithmic